The AE8200 Series Optical Wavelength Meter is a new benchmark that delivers high-precision wavelength measurements from 900 to 1700 nm with an accuracy of ±0.2 ppm. Integrating Michelson interferometry and FFT-based signal processing technology, it precisely analyzes both single-wavelength and multi-wavelength signals (such as DWDM systems and FP laser multi-channel optical signals). Designed for superior stability, reliability, and high-speed operation, the AE8200 features an open data interface to ensure seamless integration with automated test systems, effectively overcoming complex wavelength measurement challenges

Key Features and Specifications:

• Wavelength Range: 900 nm to 1700 nm

• Wavelength Accuracy: ±0.2 ppm

• Simultaneously measurement of up to 1024 wavelengths